Automated Test Equipment (ATE) uses cutting edge automation technology to quickly measure and evaluate Integrated Circuits' test results. The unit undergoing testing is commonly known as Device Under Test (DUT). To make these systems more efficient and test complex circuits in a production environment, they need to be very fast, have clean signal switching, excellent temperature control, and make good thermal contact. Panasonic meets these challenges by offering various solutions that include our PhotoMOS® Solid-State Relays, Thermal Interface Materials, etc.
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